-#define REG_PATTERN_TEST(R, M, W) \
-{ \
- uint32_t pat, val; \
- const uint32_t test[] = \
- {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF}; \
- for (pat = 0; pat < ARRAY_SIZE(test); pat++) { \
- E1000_WRITE_REG(&adapter->hw, R, (test[pat] & W)); \
- val = E1000_READ_REG(&adapter->hw, R); \
- if (val != (test[pat] & W & M)) { \
- DPRINTK(DRV, ERR, "pattern test reg %04X failed: got " \
- "0x%08X expected 0x%08X\n", \
- E1000_##R, val, (test[pat] & W & M)); \
- *data = (adapter->hw.mac_type < e1000_82543) ? \
- E1000_82542_##R : E1000_##R; \
- return 1; \
- } \
- } \
+static bool reg_pattern_test(struct e1000_adapter *adapter, uint64_t *data,
+ int reg, uint32_t mask, uint32_t write)
+{
+ static const uint32_t test[] =
+ {0x5A5A5A5A, 0xA5A5A5A5, 0x00000000, 0xFFFFFFFF};
+ uint8_t __iomem *address = adapter->hw.hw_addr + reg;
+ uint32_t read;
+ int i;
+
+ for (i = 0; i < ARRAY_SIZE(test); i++) {
+ writel(write & test[i], address);
+ read = readl(address);
+ if (read != (write & test[i] & mask)) {
+ DPRINTK(DRV, ERR, "pattern test reg %04X failed: "
+ "got 0x%08X expected 0x%08X\n",
+ reg, read, (write & test[i] & mask));
+ *data = reg;
+ return true;
+ }
+ }
+ return false;